Invention Grant
US09250291B2 System for testing an integrated circuit of a device and its method of use
有权
用于测试设备集成电路的系统及其使用方法
- Patent Title: System for testing an integrated circuit of a device and its method of use
- Patent Title (中): 用于测试设备集成电路的系统及其使用方法
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Application No.: US13554722Application Date: 2012-07-20
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Publication No.: US09250291B2Publication Date: 2016-02-02
- Inventor: Scott E. Lindsey , Jovan Jovanovic , David S. Hendrickson , Donald P. Richmond, II
- Applicant: Scott E. Lindsey , Jovan Jovanovic , David S. Hendrickson , Donald P. Richmond, II
- Applicant Address: US CA Fremont
- Assignee: AEHR TEST SYSTEMS
- Current Assignee: AEHR TEST SYSTEMS
- Current Assignee Address: US CA Fremont
- Agent Stephen M. De Klerk
- Main IPC: G01R31/20
- IPC: G01R31/20 ; G01R31/28 ; G01R31/319
Abstract:
A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.
Public/Granted literature
- US20120280704A1 SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE Public/Granted day:2012-11-08
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