Invention Grant
- Patent Title: Measuring system
- Patent Title (中): 测量系统
-
Application No.: US13792240Application Date: 2013-03-11
-
Publication No.: US09250279B2Publication Date: 2016-02-02
- Inventor: Hung-Kai Chang , Chung-Yaw Su , Chiu-Hsien Chang
- Applicant: Wistron Corporation
- Applicant Address: TW Hsichih, New Taipei
- Assignee: Wistron Corporation
- Current Assignee: Wistron Corporation
- Current Assignee Address: TW Hsichih, New Taipei
- Agent Winston Hsu; Scott Margo
- Priority: TW101126259A 20120720
- Main IPC: G01R29/26
- IPC: G01R29/26 ; G01R1/067 ; G01R23/16 ; G01R31/00

Abstract:
A measuring system for measuring signal characteristics on a node is disclosed. The measuring system includes a contact measuring unit including a probe for contacting the node to fetch a signal on the node, an output interface, a plurality of capacitors coupled between the probe and the output interface where a capacitance of each capacitor corresponds to a frequency range, and a protection circuit, of which one terminal coupled between the probe and the output interface and the other terminal coupled to a ground terminal, and a frequency analyzer coupled to the output interface for displaying information of amplitude vs. frequency of a signal outputted from the output interface to measure the signal characteristic on the node.
Public/Granted literature
- US20140021964A1 Measuring System Public/Granted day:2014-01-23
Information query