Invention Grant
- Patent Title: Method and apparatus for inspecting a gas sample
- Patent Title (中): 用于检查气体样品的方法和装置
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Application No.: US13514301Application Date: 2010-12-07
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Publication No.: US09250218B2Publication Date: 2016-02-02
- Inventor: Yuval Ovadia , Amos Linenberg
- Applicant: Yuval Ovadia , Amos Linenberg , Yorai Linenberg
- Applicant Address: IL Shefayim
- Assignee: S.T.I. Security Technology Integration Ltd.
- Current Assignee: S.T.I. Security Technology Integration Ltd.
- Current Assignee Address: IL Shefayim
- International Application: PCT/IL2010/001035 WO 20101207
- International Announcement: WO2011/070574 WO 20110616
- Main IPC: G01N1/18
- IPC: G01N1/18 ; G01N30/02 ; G01N30/08 ; G01N30/30 ; G01N1/40 ; G01N30/12 ; G01N30/14 ; G01N1/22 ; G01N1/02

Abstract:
An apparatus for detecting a presence of at least one analyte in a gas sample. The apparatus comprises a pump for drawing a gas sample from an ambient air, a passage having first and second ends, a chamber connected to the first end and containing a concentrating element for collecting at least one analyte from the gas sample, a chromatographic separator connected to a second end of the passage, and a gas source for streaming a carrier gas via the chamber to transfer the at least one analyte toward at least one chemical detector, via the chromatographic separator, in a first direction. The pump draws the gas sample via the chamber in a second direction and the first and second directions are substantially opposing to one another.
Public/Granted literature
- US20130125620A1 METHOD AND APPARATUS FOR INSPECTING A GAS SAMPLE Public/Granted day:2013-05-23
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