Invention Grant
- Patent Title: X-ray imaging apparatus, and X-ray imaging method
- Patent Title (中): X射线成像装置和X射线成像方法
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Application No.: US13925144Application Date: 2013-06-24
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Publication No.: US09250199B2Publication Date: 2016-02-02
- Inventor: Kazuhiko Omote , Yoshihiko Takeda
- Applicant: Rigaku Corporation
- Applicant Address: JP
- Assignee: RIGAKU CORPORATION
- Current Assignee: RIGAKU CORPORATION
- Current Assignee Address: JP
- Agency: Cantor Colburn LLP
- Priority: JP2012-147719 20120629
- Main IPC: G01N23/04
- IPC: G01N23/04 ; A61B6/00 ; A61B8/08

Abstract:
An X-ray imaging apparatus and an X-ray imaging method that can stitch transmission images detected by a two-dimensional detector at different positions of the sample are provided. An X-ray imaging apparatus and an X-ray imaging method include: an X-ray generating unit configured to irradiate a sample with a substantially parallel X-ray; a two-dimensional detector including a detection region; a stage where a support base is mounted is configured to move the support base in a plane along a plane of the detection region; and an imaging control unit configured to generate stitched transmission image data based on a plurality of transmission images of the sample detected by the two-dimensional detector. The imaging control unit is configured to stitch the transmission images at a plurality of mutually different positions in the sample to generate the stitched transmission image data.
Public/Granted literature
- US20140003578A1 X-RAY IMAGING APPARATUS, AND X-RAY IMAGING METHOD Public/Granted day:2014-01-02
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