Invention Grant
- Patent Title: Test solution for a random number generator
- Patent Title (中): 随机数发生器的测试解决方案
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Application No.: US14193932Application Date: 2014-02-28
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Publication No.: US09231567B2Publication Date: 2016-01-05
- Inventor: Chinsong Sul , Hyukyong Kwon , Andy Ng
- Applicant: Silicon Image, Inc.
- Applicant Address: US OR Portland
- Assignee: Lattice Semiconductor Corporation
- Current Assignee: Lattice Semiconductor Corporation
- Current Assignee Address: US OR Portland
- Agency: Fenwick & West LLP
- Main IPC: H03B29/00
- IPC: H03B29/00 ; H03K3/03 ; G06F7/58
Abstract:
A random number generator and method for testing the same are described. In one embodiment, the random number generator comprises one or more ring oscillator structures, each of the one or more ring oscillator structures having a ring oscillator for use in generating random numbers and having a test structure to reconfigure the ring oscillator into a testable structure.
Public/Granted literature
- US20140191813A1 Test Solution for a Random Number Generator Public/Granted day:2014-07-10
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