Invention Grant
US09153306B2 Tunnel magnetoresistive effect element and random access memory using same
有权
隧道磁阻效应元件和使用其的随机存取存储器
- Patent Title: Tunnel magnetoresistive effect element and random access memory using same
- Patent Title (中): 隧道磁阻效应元件和使用其的随机存取存储器
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Application No.: US14356739Application Date: 2011-11-08
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Publication No.: US09153306B2Publication Date: 2015-10-06
- Inventor: Hideo Ohno , Shoji Ikeda , Hiroyuki Yamamoto , Yosuke Kurosaki , Katsuya Miura
- Applicant: Hideo Ohno , Shoji Ikeda , Hiroyuki Yamamoto , Yosuke Kurosaki , Katsuya Miura
- Applicant Address: JP Sendai-Shi
- Assignee: TOHOKU UNIVERSITY
- Current Assignee: TOHOKU UNIVERSITY
- Current Assignee Address: JP Sendai-Shi
- Agency: Brinks Gilson & Lione
- International Application: PCT/JP2011/075698 WO 20111108
- International Announcement: WO2013/069091 WO 20130516
- Main IPC: G11C11/16
- IPC: G11C11/16 ; H01L43/10 ; H01L43/08 ; H01L27/22

Abstract:
Provided is a tunnel magnetoresistive effect element such that a high TMR ratio and a low write current can be realized, and the thermal stability factor (E/kBT) of a recording layer and a pinned layer is increased while an increase in resistance of the element as a whole is suppressed, thus enabling a stable operation. On at least one of a recording layer 21 and a pinned layer 22 each comprising CoFeB, electrically conductive oxide layers 31 and 32 are disposed on a side opposite to a tunnel barrier layer 10.
Public/Granted literature
- US20140340961A1 TUNNEL MAGNETORESISTIVE EFFECT ELEMENT AND RANDOM ACCESS MEMORY USING SAME Public/Granted day:2014-11-20
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