Invention Grant
- Patent Title: Apparatus and methods for leakage current reduction in integrated circuits
- Patent Title (中): 集成电路中漏电流降低的装置和方法
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Application No.: US14025529Application Date: 2013-09-12
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Publication No.: US09100002B2Publication Date: 2015-08-04
- Inventor: Christophe Vincent Antoine Laurent
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Knobbe Martens Olson & Bear LLP
- Main IPC: G06F7/38
- IPC: G06F7/38 ; H03K19/00 ; G06F17/50

Abstract:
This disclosure relates to leakage current reduction in integrated circuits (ICs). In one aspect, an IC can include a digital logic circuit and a polarization circuit. The digital logic circuit can have a plurality of inputs and can include a plurality of logic gates. The polarization circuit can receive a standby signal and a digital input signal comprising a plurality of bits. When the standby signal is deactivated, the polarization circuit can control the plurality of inputs of the digital logic circuit based on the digital input signal. However, when the standby signal is activated the polarization circuit can control the plurality of inputs of the digital logic circuit to a low power state associated with a smaller leakage current of the plurality of logic gates relative to at least one other state of the digital logic circuit.
Public/Granted literature
- US20150070049A1 APPARATUS AND METHODS FOR LEAKAGE CURRENT REDUCTION IN INTEGRATED CIRCUITS Public/Granted day:2015-03-12
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