Invention Grant
- Patent Title: Semiconductor photo-detection device and radiation detection apparatus
- Patent Title (中): 半导体光检测装置及放射线检测装置
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Application No.: US14055923Application Date: 2013-10-17
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Publication No.: US09099599B2Publication Date: 2015-08-04
- Inventor: Tatsumi Yamanaka
- Applicant: Hamamatsu Photonics K.K.
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JPP2003-359737 20031020
- Main IPC: H01L27/146
- IPC: H01L27/146 ; H01L31/118 ; H01L27/144 ; G01T1/20

Abstract:
On the front side of an n-type semiconductor substrate, p-type regions are two-dimensionally arranged in an array. A high-concentration n-type region and a p-type region are disposed between the p-type regions adjacent each other. The high-concentration n-type region is formed by diffusing an n-type impurity from the front side of the substrate so as to surround the p-type region as seen from the front side. The p-type region is formed by diffusing a p-type impurity from the front side of the substrate so as to surround the p-type region and high-concentration n-type region as seen from the front side. Formed on the front side of the n-type semiconductor substrate are an electrode electrically connected to the p-type region and an electrode electrically connected to the high-concentration n-type region and the p-type region.
Public/Granted literature
- US20140084173A1 SEMICONDUCTOR PHOTO-DETECTION DEVICE AND RADIATION DETECTION APPARATUS Public/Granted day:2014-03-27
Information query
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