Invention Grant
- Patent Title: Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatus
- Patent Title (中): 带电粒子辐射装置,以及在带电粒子辐射装置中显示三维信息的方法
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Application No.: US13503976Application Date: 2010-10-22
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Publication No.: US09099281B2Publication Date: 2015-08-04
- Inventor: Toshie Yaguchi , Yasuhira Nagakubo , Junzo Azuma , Akira Watabe
- Applicant: Toshie Yaguchi , Yasuhira Nagakubo , Junzo Azuma , Akira Watabe
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2009-245029 20091026
- International Application: PCT/JP2010/068656 WO 20101022
- International Announcement: WO2011/052489 WO 20110505
- Main IPC: H04N13/02
- IPC: H04N13/02 ; H01J37/26 ; G01N23/22 ; H01J37/18 ; H01J37/20 ; G01N23/225

Abstract:
Disclosed is a charged particle radiation apparatus capable of capturing a change in a sample due to gaseous atmosphere, light irradiation, heating or the like without exposing the sample to atmosphere. The present invention relates to a sample holder provided with a sample stage that is rotatable around a rotation axis perpendicular to an electron beam irradiation direction, the sample holder being capable of forming an airtight chamber around the sample stage. A sample is allowed to chemically react in any atmosphere, and three-dimensional analysis on the reaction is enabled. A sample liable to change in atmosphere can be three-dimensionally analyzed without exposing the sample to the atmosphere.
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