Invention Grant
- Patent Title: Apparatus and method for estimating parameter of secondary battery
- Patent Title (中): 二次电池参数估算装置及方法
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Application No.: US14527505Application Date: 2014-10-29
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Publication No.: US09097773B2Publication Date: 2015-08-04
- Inventor: Won-Tae Joe , Geun-Chang Chung , Sun-Young Cha
- Applicant: LG CHEM, LTD.
- Applicant Address: KR Seoul
- Assignee: LG Chem, Ltd.
- Current Assignee: LG Chem, Ltd.
- Current Assignee Address: KR Seoul
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: KR10-2012-0045868 20120430; KR10-2013-0028284 20130315
- Main IPC: G01R31/36
- IPC: G01R31/36 ; H01M10/48

Abstract:
Disclosed is an apparatus and method for estimating a parameter of a secondary battery. The apparatus includes a sensor configured to measure an open circuit voltage (OCVm) of the secondary battery at a first depth of discharge (DOD′), the open circuit voltage (OCVm) corresponding to a difference between a predetermined original cathode voltage (Vc,o) at the first depth of discharge (DOD′) and an anode voltage (Va), and a control unit configured to calculate an anode voltage (Va) from the original cathode voltage (Vc,o) and the open circuit voltage (OCVm), determining that the original anode voltage (Va,o) is identical to the anode voltage (Va), determining a second depth of discharge (DOD″) corresponding to the original anode voltage (Va,o), and determining capacity degradation (Δcapa) of the secondary battery according to a difference between the first depth of discharge (DOD′) and the second depth of discharge (DOD″).
Public/Granted literature
- US20150066407A1 APPARATUS AND METHOD FOR ESTIMATING PARAMETER OF SECONDARY BATTERY Public/Granted day:2015-03-05
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