Invention Grant
US09077927B2 Image inspection system and image inspection method for determining a threshold useable for defect detection in a scanned image based upon a reference image with an artificial defect
有权
用于基于具有人造缺陷的参考图像来确定用于扫描图像中的缺陷检测的阈值的图像检查系统和图像检查方法
- Patent Title: Image inspection system and image inspection method for determining a threshold useable for defect detection in a scanned image based upon a reference image with an artificial defect
- Patent Title (中): 用于基于具有人造缺陷的参考图像来确定用于扫描图像中的缺陷检测的阈值的图像检查系统和图像检查方法
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Application No.: US13952782Application Date: 2013-07-29
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Publication No.: US09077927B2Publication Date: 2015-07-07
- Inventor: Hiromitsu Miyagawa , Tadashi Kitai
- Applicant: Hiromitsu Miyagawa , Tadashi Kitai
- Applicant Address: JP Tokyo
- Assignee: RICOH COMPANY, LTD.
- Current Assignee: RICOH COMPANY, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2012-171946 20120802; JP2013-151922 20130722
- Main IPC: H04N1/40
- IPC: H04N1/40 ; H04N1/00

Abstract:
An image inspection system for inspecting an image output on a recording medium includes an image forming unit to form a threshold setting image on the recording medium; an image scanner to scan the threshold setting image to generate a scanned image; an inspection reference image generator to generate an inspection reference image using data of the an output-target image; an image inspection unit to determine a defect in the scanned image based on a difference between the inspection reference image and the scanned image; and a threshold determiner to determine a threshold to be compared with the difference between the inspection reference image and the scanned image. The image inspection unit computes the difference between the scanned image and the inspection reference image. The threshold determiner determines a threshold to be compared with the difference between the scanned image and the inspection reference image.
Public/Granted literature
- US20140036290A1 IMAGE INSPECTION SYSTEM AND IMAGE INSPECTION METHOD Public/Granted day:2014-02-06
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