Invention Grant
- Patent Title: Mass spectrometer method and mass spectrometer
- Patent Title (中): 质谱仪和质谱仪
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Application No.: US13365355Application Date: 2012-02-03
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Publication No.: US09076638B2Publication Date: 2015-07-07
- Inventor: Masuyuki Sugiyama , Yuichiro Hashimoto , Hideki Hasegawa , Shuhei Hashiba , Shun Kumano
- Applicant: Masuyuki Sugiyama , Yuichiro Hashimoto , Hideki Hasegawa , Shuhei Hashiba , Shun Kumano
- Applicant Address: JP Tokyo
- Assignee: HITACHI-HIGH TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI-HIGH TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2011-047101 20110304
- Main IPC: H01J49/26
- IPC: H01J49/26 ; H01J49/00

Abstract:
A variation in an ionization efficiency and the amount of sample which is introduced into an ion trap is corrected and quantified. Ions of an internal standard and ions of a sample are trapped in the ion trap at the same time, and a concentration of the sample is quantified according to an intensity of the ions of the internal standard which are mass-selectively ejected, and an intensity of fragment ions of the sample.
Public/Granted literature
- US20120223223A1 MASS SPECTROMETER METHOD AND MASS SPECTROMETER Public/Granted day:2012-09-06
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