Invention Grant
- Patent Title: Fuse information storage circuit of semiconductor apparatus
- Patent Title (中): 半导体装置的保险丝信息存储电路
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Application No.: US14100168Application Date: 2013-12-09
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Publication No.: US09076538B2Publication Date: 2015-07-07
- Inventor: Chang Ki Baek
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2013-0103772 20130830
- Main IPC: G11C17/00
- IPC: G11C17/00 ; G11C17/16 ; G11C29/44
Abstract:
A test mode decoder configured to decode a test mode signal inputted a plurality of times and to generate preliminary fuse information, a count latch configured to count the preliminary fuse information in response to a count clock signal and to generate fuse information, and a fuse array block configured to store the fuse information can be included.
Public/Granted literature
- US20150062997A1 FUSE INFORMATION STORAGE CIRCUIT OF SEMICONDUCTOR APPARATUS Public/Granted day:2015-03-05
Information query
