Invention Grant
- Patent Title: Test and connection apparatus arrangement, and test apparatus
- Patent Title (中): 测试和连接设备布置以及测试设备
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Application No.: US14123212Application Date: 2012-05-21
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Publication No.: US09075084B2Publication Date: 2015-07-07
- Inventor: Frank Hackemack , Joerg Richts , Bernhard Jaschke
- Applicant: Frank Hackemack , Joerg Richts , Bernhard Jaschke
- Applicant Address: DE Detmold
- Assignee: WEIDMUELLER INTERFACE GMBH & CO. KG
- Current Assignee: WEIDMUELLER INTERFACE GMBH & CO. KG
- Current Assignee Address: DE Detmold
- Agent Lawrence E. Laubscher, Sr.; Lawrence E. Laubscher, Jr.; Robert D. Spendlove
- Priority: DE202011101414U 20110603
- International Application: PCT/EP2012/059392 WO 20120521
- International Announcement: WO2012/163716 WO 20121206
- Main IPC: H01H31/02
- IPC: H01H31/02 ; G01R1/04 ; H01R9/26 ; G01R1/073 ; G01R31/02 ; G01R31/327

Abstract:
A testing arrangement for testing the electrical circuits of a terminal block assembly, comprising a generally rectangular testing unit housing formed of insulating material and containing a chamber, at least one connection device mounted in chamber and having an elongated connector body formed of insulating material and including center and end portions. An integral measuring tab portion extends downwardly from the body center portion for insertion into a testing opening contained in the terminal block assembly, and a pair of coplanar measurement portions extend upwardly from the connector body ends and terminating at different elevations, thereby to afford a compact testing arrangement. Two electrical circuit connecting portions are mounted on the connector body, each including an input conductive contact plate mounted on one side of said measuring tab portion, and an output contact mounted within one of said measurement portions for connection with one end of a testing component.
Public/Granted literature
- US20140097855A1 TEST AND CONNECTION APPARATUS ARRANGEMENT, AND TEST APPARATUS Public/Granted day:2014-04-10
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