Invention Grant
US09053915B2 Radio frequency (RF) ion guide for improved performance in mass spectrometers at high pressure
有权
射频（RF）离子导向器，用于在高压下改善质谱仪的性能
- Patent Title: Radio frequency (RF) ion guide for improved performance in mass spectrometers at high pressure
- Patent Title (中): 射频（RF）离子导向器，用于在高压下改善质谱仪的性能
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Application No.: US13626698Application Date: 2012-09-25
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Publication No.: US09053915B2Publication Date: 2015-06-09
- Inventor: Trygve Ristroph , Gershon Perelman
- Applicant: Agilent Technologies, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: H01J49/06
- IPC: H01J49/06
Abstract:
Ion guides for use in mass spectrometry (MS) systems are described. The ion guides are configured to provide a reflective electrodynamic field and a direct current (DC or static) electric field to provide ion beams that are more spatially confined with a comparatively large mass range. Some ion guides are provided between the ion source and the first stage vacuum chamber of the MS system.
Public/Granted literature
- US20140084156A1 RADIO FREQUENCY (RF) ION GUIDE FOR IMPROVED PERFORMANCE IN MASS SPECTROMETERS AT HIGH PRESSURE Public/Granted day:2014-03-27
Information query
