Invention Grant
- Patent Title: Resistance-change memory
- Patent Title (中): 电阻变化记忆
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Application No.: US14016614Application Date: 2013-09-03
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Publication No.: US09053786B2Publication Date: 2015-06-09
- Inventor: Reika Ichihara , Daisuke Matsushita , Shosuke Fujii
- Applicant: Kabushiki Kaisha Toshiba
- Applicant Address: JP Minato-ku
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2011-064933 20110323
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00 ; H01L27/10 ; H01L45/00

Abstract:
According to one embodiment, a resistance-change memory includes a memory cell and a control circuit. The memory cell comprises first and second electrodes, and a variable resistance layer disposed between the first electrode and the second electrode. The control circuit applies a voltage between the first electrode and the second electrode to perform writing, erasing, and reading. During the writing, the control circuit applies a first voltage pulse between the first electrode and the second electrode, and then applies a second voltage pulse different in polarity from the first voltage pulse after applying the first voltage pulse.
Public/Granted literature
- US20140003130A1 RESISTANCE-CHANGE MEMORY Public/Granted day:2014-01-02
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