Invention Grant
- Patent Title: Measuring electrical resistance
- Patent Title (中): 测量电阻
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Application No.: US13854218Application Date: 2013-04-01
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Publication No.: US09053780B2Publication Date: 2015-06-09
- Inventor: Kuoyuan Hsu , Po-Hung Chen , Jiann-Tseng Huang , Subramani Kengeri
- Applicant: TAIWAN SEMICONDUCTOR MANFACTURING COMPANY, LTD.
- Applicant Address: TW
- Assignee: TAIWAN SEMICONDUCTOR MANFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANFACTURING COMPANY, LTD.
- Current Assignee Address: TW
- Agency: Lowe Hauptman & Ham, LLP
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C7/06 ; G11C13/00 ; G11C17/16 ; G11C17/18 ; G11C7/22 ; G11C5/14 ; G11C16/26
Abstract:
In at least one embodiment, a method includes applying an input voltage external to a semiconductor chip to a first circuit of the semiconductor chip to generate an output voltage external to the semiconductor chip. The first circuit is electrically coupled to a resistive device. A logic state of the resistive device is determined based on a logic state of the external output voltage.
Public/Granted literature
- US20130223129A1 MEASURING ELECTRICAL RESISTANCE Public/Granted day:2013-08-29
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