Invention Grant
- Patent Title: X-ray diagnostic system and X-ray diagnostic method
- Patent Title (中): X线诊断系统和X线诊断方法
-
Application No.: US13760539Application Date: 2013-02-06
-
Publication No.: US09050058B2Publication Date: 2015-06-09
- Inventor: Yoshinori Uebayashi , Satoru Nakanishi
- Applicant: Kabushiki Kaisha Toshiba , Toshiba Medical Systems Corporation
- Applicant Address: JP Tokyo JO Otawara-shi
- Assignee: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- Current Assignee: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- Current Assignee Address: JP Tokyo JO Otawara-shi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2012-025848 20120209
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B6/03

Abstract:
An X-ray diagnostic system according to an embodiment includes: an X-ray tube for radiating an X-ray to the subject on the basis of a tube current for taking a scanogram of a subject; an X-ray detector for detecting the X-ray radiated by the X-ray tube and transmitted through the subject; a data collector for collecting X-ray dose distribution data, which shows the dose distribution of the X-ray; an image processor for creating the scanogram from the X-ray dose distribution data; a genuine data generator for generating genuine data showing the dose distribution of the X-ray, from the scanogram; a threshold value setting section for setting a threshold value for the genuine data; and a tube current adjustor for adjusting a tube current for taking a tomographic image of the subject in accordance with a comparison between the X-ray dose in the genuine data and the threshold value.
Public/Granted literature
- US20130208853A1 X-RAY DIAGNOSTIC SYSTEM AND X-RAY DIAGNOSTIC METHOD Public/Granted day:2013-08-15
Information query