Invention Grant
- Patent Title: Middle of-line borderless contact structure and method of forming
- Patent Title (中): 中线无边界接触结构和成型方法
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Application No.: US14519622Application Date: 2014-10-21
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Publication No.: US09048217B2Publication Date: 2015-06-02
- Inventor: Brent A. Anderson , David V. Horak , Edward J. Nowak
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Hoffman Warnick LLC
- Agent Michael LeStrange
- Main IPC: H01L21/336
- IPC: H01L21/336 ; H01L29/417 ; H01L29/78 ; H01L29/66 ; H01L29/45 ; H01L21/3205 ; H01L21/3213 ; H01L29/76

Abstract:
Various embodiments disclosed include semiconductor structures and methods of forming such structures. In one embodiment, a method includes: providing a semiconductor structure including: a substrate; at least one gate structure overlying the substrate; and an interlayer dielectric overlying the substrate and the at least one gate structure; removing the ILD overlying the substrate to expose the substrate; forming a silicide layer over the substrate; forming a conductor over the silicide layer and the at least one gate structure; forming an opening in the conductor to expose a portion of a gate region of the at least one gate structure; and forming a dielectric in the opening in the conductor.
Public/Granted literature
- US20150035026A1 MIDDLE-OF-LINE BORDERLESS CONTACT STRUCTURE AND METHOD OF FORMING Public/Granted day:2015-02-05
Information query
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