Invention Grant
- Patent Title: Time-of-flight mass spectrometer with accumulating electron impact ion source
- Patent Title (中): 飞行时间质谱仪带有电子碰撞离子源
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Application No.: US13817519Application Date: 2011-08-18
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Publication No.: US09048080B2Publication Date: 2015-06-02
- Inventor: Anatoly N. Verenchikov , Yuri Khasin
- Applicant: Anatoly N. Verenchikov , Yuri Khasin
- Applicant Address: US MI St. Joseph
- Assignee: LECO Corporation
- Current Assignee: LECO Corporation
- Current Assignee Address: US MI St. Joseph
- Agency: Honigman Miller Schwartz and Cohn LLP
- International Application: PCT/US2011/048198 WO 20110818
- International Announcement: WO2012/024468 WO 20120223
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/14 ; H01J49/40

Abstract:
An accumulating ion source for a mass spectrometer that includes a sample injector (328) introducing sample vapors into an ionization space (115) and an electron emitter (102) emitting a continuous electron beam (104) into the ionization space (115) to generate analyte ions. The accumulating ion source further includes first and second electrodes (108a, 108b) arranged spaced apart in the ionization space (115) for accumulating analyte ions substantially therebetween. The first and second electrodes (108a, 108b) receive periodic extraction energy potentials to accelerate packets of analyte ions from the ionization space (115) along a first axis. An orthogonal accelerator (140) receives the packets of analyte ions along the first axis and periodically accelerates the packets of analyte ions along a second axis substantially orthogonal to the first axis. A time delay between the extraction acceleration and the acceleration of each respective packet of analyte ions provides a proportional mass range of the respective packet of analyte ions.
Public/Granted literature
- US20130206978A1 TIME-OF-FLIGHT MASS SPECTROMETER WITH ACCUMULATING ELECTRON IMPACT ION SOURCE Public/Granted day:2013-08-15
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