Invention Grant
- Patent Title: Imaging mass spectrometer and method of controlling same
- Patent Title (中): 成像质谱仪及其控制方法
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Application No.: US14025317Application Date: 2013-09-12
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Publication No.: US09048071B2Publication Date: 2015-06-02
- Inventor: Takaya Satoh
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2012-202793 20120914
- Main IPC: H01J49/40
- IPC: H01J49/40 ; H01J49/04 ; H01J49/00 ; H01J49/02 ; H01J49/06

Abstract:
An imaging mass spectrometer capable of reducing the dependence of the resolution of a projection image on mass is offered. Also, a method of controlling this spectrometer is offered. The imaging mass spectrometer includes: a plate on which a sample is placed; a lens system through which ions generated by irradiating the sample with laser light pass; an ion optical system for separating the ions according to flight time corresponding to mass-to-charge ratio; a detection system for measuring arrival positions and flight times of the ions passed through the ion optical system and generating an image of the sample when it is ionized; and a voltage control portion for sweeping the voltage applied to an electrode included in the lens system such that the lens effect of the lens system increases with time during a given period synchronized with the laser irradiation.
Public/Granted literature
- US20140166874A1 Imaging Mass Spectrometer and Method of Controlling Same Public/Granted day:2014-06-19
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