Invention Grant
- Patent Title: Electron beam apparatus
- Patent Title (中): 电子束装置
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Application No.: US14611854Application Date: 2015-02-02
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Publication No.: US09048063B1Publication Date: 2015-06-02
- Inventor: Weiming Ren , Shuai Li , Zhongwei Chen
- Applicant: Hermes Microvision, Inc.
- Applicant Address: TW Hsinchu
- Assignee: HERMES MICROVISION, INC.
- Current Assignee: HERMES MICROVISION, INC.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, PC
- Agent Justin King
- Main IPC: H01J37/12
- IPC: H01J37/12

Abstract:
This invention provides a method for improving performance of a reflective type energy filter for a charged particle beam, which employs a beam-adjusting lens on an entrance side of a potential barrier of the energy filter to make the charged particle beam become a substantially parallel beam to be incident onto the potential barrier. The method makes the energy filter have both a fine energy-discrimination power over a large emission angle spread and a high uniformity of energy-discrimination powers over a large FOV. A LVSEM using this method in the energy filter can obviously improve image contrast. The invention also provides multiple energy-discrimination detection devices formed by using the advantages of the method.
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