Invention Grant
- Patent Title: Microlithographic projection exposure apparatus
- Patent Title (中): 微光刻投影曝光装置
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Application No.: US13007039Application Date: 2011-01-14
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Publication No.: US09046787B2Publication Date: 2015-06-02
- Inventor: Toralf Gruner , Alexander Epple , Markus Degünther
- Applicant: Toralf Gruner , Alexander Epple , Markus Degünther
- Applicant Address: DE Oberkochen
- Assignee: Carl Zeiss SMT GmbH
- Current Assignee: Carl Zeiss SMT GmbH
- Current Assignee Address: DE Oberkochen
- Agency: Fish & Richardson P.C.
- Main IPC: G03B27/42
- IPC: G03B27/42 ; G03F7/20

Abstract:
A projection exposure apparatus has a projection lens with an object plane, an image plane, an optical axis and a non-telecentric entrance pupil. The apparatus further comprises an illumination system having an intermediate field plane and a field stop. The field stop is positioned in or in close proximity to the intermediate field plane and defines an illuminated field in the object plane that does not contain the optical axis of the projection lens. The illumination system is configured such that, in the object plane, a mean of the angles formed between all principal rays emanating from the intermediate field plane on the one hand and the optical axis of the projection lens on the other hand differs from 0°.
Public/Granted literature
- US20110109893A1 MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS Public/Granted day:2011-05-12
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