Invention Grant
- Patent Title: Method and device for diagnosing secondary battery degradation
- Patent Title (中): 诊断二次电池退化的方法和装置
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Application No.: US13382410Application Date: 2010-12-10
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Publication No.: US09046586B2Publication Date: 2015-06-02
- Inventor: Shin-ichi Yuasa
- Applicant: Shin-ichi Yuasa
- Applicant Address: JP Osaka
- Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2010-074152 20100329
- International Application: PCT/JP2010/007192 WO 20101210
- International Announcement: WO2011/121692 WO 20111006
- Main IPC: G01R31/36
- IPC: G01R31/36 ; H01M10/44 ; H01M10/48

Abstract:
During charging of a secondary battery, a rate of voltage change dV/dt is obtained when a voltage V of the secondary battery reaches a predetermined voltage Vpre, a charge current I for charging the secondary battery is detected, and a rate of change dQ/dt in a quantity of charged electricity Q of the secondary battery is calculated on the basis of the result of the detection. Here, the predetermined voltage Vpre is a voltage higher than a discharge cutoff voltage and lower than a charge cutoff voltage. Thereafter, a ratio X: dQ/dV, of the rate of change dQ/dt in the quantity of charged electricity to the rate of voltage change dV/dt is calculated. The calculated ratio X is compared with a reference value Xref, and degradation of the secondary battery is determined on the basis of the result of the comparison.
Public/Granted literature
- US20120116701A1 METHOD AND DEVICE FOR DIAGNOSING SECONDARY BATTERY DEGRADATION Public/Granted day:2012-05-10
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