Invention Grant
- Patent Title: Nondestructive examination of structures having embedded particles
- Patent Title (中): 具有嵌入颗粒的结构的非破坏性检查
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Application No.: US13647423Application Date: 2012-10-09
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Publication No.: US09042516B2Publication Date: 2015-05-26
- Inventor: James A. Grossnickle , Robert B. Greegor
- Applicant: The Boeing Company
- Applicant Address: US IL Chicago
- Assignee: The Boeing Company
- Current Assignee: The Boeing Company
- Current Assignee Address: US IL Chicago
- Agent Hugh P. Gortler
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01N23/087
Abstract:
A system comprises a structure having particles embedded at a level within the structure, and X-ray imaging apparatus for capturing images of the particles at the level.
Public/Granted literature
- US20140098936A1 NONDESTRUCTIVE EXAMINATION OF STRUCTURES HAVING EMBEDDED PARTICLES Public/Granted day:2014-04-10
Information query
