Invention Grant
- Patent Title: System and method for testing data at a data warehouse
- Patent Title (中): 用于在数据仓库测试数据的系统和方法
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Application No.: US13048236Application Date: 2011-03-15
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Publication No.: US09037549B2Publication Date: 2015-05-19
- Inventor: Saji Valiyattil Sankaranarayanan , Mahesh Gudipati , Ajay Kumar Kachottil , Shyam Balasubramoni Ayyar , Sreejan Manezhathu Janardhanan
- Applicant: Saji Valiyattil Sankaranarayanan , Mahesh Gudipati , Ajay Kumar Kachottil , Shyam Balasubramoni Ayyar , Sreejan Manezhathu Janardhanan
- Applicant Address: IN
- Assignee: Infosys Limited
- Current Assignee: Infosys Limited
- Current Assignee Address: IN
- Agency: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- Priority: IN3743/CHE/2010 20101208
- Main IPC: G06F17/30
- IPC: G06F17/30

Abstract:
A system and method for performing testing of data at a data warehouse is provided. The methodology of the invention describes steps to develop and further invoke one or more data quality-accuracy test cases from a framework. The data quality-accuracy test cases check the sanity of the data stored at the data warehouse. The one or more data quality-accuracy test cases are developed based on at least one predefined strategy, which in turn are stored in the framework. The methodology further executes the developed one or more data quality-accuracy test cases as either batch or independently, based on the requirements of the test. Thereafter, the methodology maintains traceability of the executed test at the data warehouse, incorporating details from the development of the one or more data quality-accuracy test cases to the final output of the test.
Public/Granted literature
- US20120150820A1 SYSTEM AND METHOD FOR TESTING DATA AT A DATA WAREHOUSE Public/Granted day:2012-06-14
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