Invention Grant
- Patent Title: Spectrum measuring apparatus
- Patent Title (中): 光谱测量仪
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Application No.: US13322019Application Date: 2009-05-29
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Publication No.: US09036147B2Publication Date: 2015-05-19
- Inventor: Ryuji Funayama , Shinya Kawamata , Yasukata Yokochi , Masato Endo , Yasuhiro Yoshida , Kenichi Kitahama
- Applicant: Ryuji Funayama , Shinya Kawamata , Yasukata Yokochi , Masato Endo , Yasuhiro Yoshida , Kenichi Kitahama
- Applicant Address: JP Toyota-shi
- Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee Address: JP Toyota-shi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- International Application: PCT/JP2009/059916 WO 20090529
- International Announcement: WO2010/137176 WO 20101202
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01J3/02 ; G01J3/04 ; G01J3/32 ; G01J3/36

Abstract:
Disclosed is a spectrum measuring apparatus for shortening such a measurement time period for an object being measured including two or more mutually different measurement portions as is required for the spectrum measurements of the lights from individual measurement portions. The spectrum measuring apparatus comprises a slit group having two or more slits, a spectroscope for separating the lights extracted by the slit group, for the individual slits, and a measuring unit for measuring the intensities of the individual components, which are separated by the spectroscope, for the slits. The individual slits extract such ones of the lights coming from an object being measured including two or more mutually different measurement portions, as come from the individual measurement portions.
Public/Granted literature
- US20120105846A1 SPECTRUM MEASURING APPARATUS Public/Granted day:2012-05-03
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