Invention Grant
- Patent Title: Forming fence conductors using spacer etched trenches
- Patent Title (中): 使用间隔蚀刻沟槽形成栅栏导体
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Application No.: US13836647Application Date: 2013-03-15
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Publication No.: US09034758B2Publication Date: 2015-05-19
- Inventor: Paul Fest
- Applicant: Microchip Technology Incorporated
- Applicant Address: US AZ Chandler
- Assignee: MICROCHIP TECHNOLOGY INCORPORATED
- Current Assignee: MICROCHIP TECHNOLOGY INCORPORATED
- Current Assignee Address: US AZ Chandler
- Agency: King & Spalding L.L.P.
- Main IPC: H01L21/44
- IPC: H01L21/44 ; H01L23/528 ; H01L21/768

Abstract:
A spacer etching process produces ultra-narrow conductive lines in a plurality of semiconductor dice. Trenches are formed in a first dielectric then a sacrificial film is deposited onto the first dielectric and the trench surfaces formed therein. Planar sacrificial film is removed from the face of the first dielectric and bottom of the trenches, leaving only sacrificial films on the trench walls. A gap between the sacrificial films on the trench walls is filled in with a second dielectric. A portion of the second dielectric is removed to expose tops of the sacrificial films. The sacrificial films are removed leaving ultra-thin gaps that are filled in with a conductive material. The tops of the conductive material in the gaps are exposed to create “fence conductors.” Portions of the fence conductors and surrounding insulating materials are removed at appropriate locations to produce desired conductor patterns comprising isolated fence conductors.
Public/Granted literature
- US20140264882A1 Forming Fence Conductors Using Spacer Etched Trenches Public/Granted day:2014-09-18
Information query
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