Invention Grant
- Patent Title: Memory error test routine
- Patent Title (中): 内存错误测试程序
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Application No.: US13485824Application Date: 2012-05-31
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Publication No.: US08990646B2Publication Date: 2015-03-24
- Inventor: Naveen Muralimanohar , Norman Paul Jouppi , Melvin K Benedict , Andrew C. Walton
- Applicant: Naveen Muralimanohar , Norman Paul Jouppi , Melvin K Benedict , Andrew C. Walton
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Agency: Hewlett-Packard Patent Department
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C7/00 ; G11C29/56 ; G11C29/44
Abstract:
An error test routine tests for a type of memory error by changing a content of a memory module. A memory handling procedure isolates the memory error in response to a positive outcome of the error test routine. The error test routine and memory handling procedure are to be performed at runtime transparent to an operating system. Information corresponding to isolating the memory error is stored.
Public/Granted literature
- US20130326293A1 MEMORY ERROR TEST ROUTINE Public/Granted day:2013-12-05
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