Invention Grant
- Patent Title: Fluorescence intensity compensation method and fluorescence intensity calculation device
- Patent Title (中): 荧光强度补偿方法和荧光强度计算装置
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Application No.: US13178172Application Date: 2011-07-07
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Publication No.: US08990024B2Publication Date: 2015-03-24
- Inventor: Yasunobu Kato , Yoshitsugu Sakai
- Applicant: Yasunobu Kato , Yoshitsugu Sakai
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: K&L Gates LLP
- Priority: JP2010-156382 20100709
- Main IPC: G06F19/16
- IPC: G06F19/16 ; G06F19/10 ; G01N15/14 ; G01N21/53 ; G01N21/64 ; G01N21/47

Abstract:
A fluorescence intensity compensation method, includes: receiving, with photodetectors having different input wavelength bands, fluorescence emitted from fluorochromes excited by irradiating light on microparticles multiply-labeled by a plurality of fluorochromes with overlapping fluorescence wavelengths; collecting detected values for the photodetectors; and obtaining a measurement spectrum, by approximating, from the linear sum of single-stain spectrums obtained from microparticles individually labeled with the fluorochromes; wherein approximation of the measurement spectrum by the linear sum of the single-stain spectrums is performed using the restricted least-square method.
Public/Granted literature
- US20120010822A1 FLUORESCENCE INTENSITY COMPENSATION METHOD AND FLUORESCENCE INTENSITY CALCULATION DEVICE Public/Granted day:2012-01-12
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