Invention Grant
- Patent Title: Systems and methods for enhanced media defect detection
- Patent Title (中): 增强介质缺陷检测的系统和方法
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Application No.: US13561243Application Date: 2012-07-30
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Publication No.: US08972800B2Publication Date: 2015-03-03
- Inventor: Fan Zhang , Weijun Tan , Ming Jin , Haitao Xia
- Applicant: Fan Zhang , Weijun Tan , Ming Jin , Haitao Xia
- Applicant Address: US CA San Jose
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA San Jose
- Agency: Hamilton DeSanctis & Cha
- Main IPC: G06F11/07
- IPC: G06F11/07
Abstract:
Various embodiments of the present invention provide systems and methods for media defect detection.
Public/Granted literature
- US20140032982A1 Systems and Methods for Enhanced Media Defect Detection Public/Granted day:2014-01-30
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