Invention Grant
- Patent Title: Method and system for determining parameters of sinusoidal signals
- Patent Title (中): 用于确定正弦信号参数的方法和系统
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Application No.: US13075558Application Date: 2011-03-30
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Publication No.: US08972215B2Publication Date: 2015-03-03
- Inventor: Zafer Sahinoglu , Ming Sun , Koon Hoo Teo
- Applicant: Zafer Sahinoglu , Ming Sun , Koon Hoo Teo
- Applicant Address: US MA Cambridge
- Assignee: Mitsubishi Electric Research Laboratories, Inc.
- Current Assignee: Mitsubishi Electric Research Laboratories, Inc.
- Current Assignee Address: US MA Cambridge
- Agent Dirk Brinkman; Gene Vinokur
- Main IPC: G01R23/02
- IPC: G01R23/02 ; G01R25/00 ; H02J13/00 ; G06F19/00 ; G06F17/40 ; G01R23/15 ; G01R19/25
Abstract:
At least one parameter of a signal is determined, wherein the signal is a sinusoidal signal including noise, wherein the parameter includes at least one of a frequency of the signal, and an angle of a phase of the signal. The frequency of the signal is determined iteratively based on a linear relationship among the frequency of the signal, samples of the noise, and samples of the signal using a statistical correlation among the samples of the noise. During a current iteration the statistical correlation is updated based on the frequency of the signal determined during a previous iteration, and the samples of the signal are updated with values of the signal during a current period of time.
Public/Granted literature
- US20120253742A1 Method and System for Determining Parameters of Sinusoidal Signals Public/Granted day:2012-10-04
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