Invention Grant
US08971723B2 Method of and system for detecting skew between parallel signals
有权
用于检测并行信号之间的偏差的方法和系统
- Patent Title: Method of and system for detecting skew between parallel signals
- Patent Title (中): 用于检测并行信号之间的偏差的方法和系统
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Application No.: US13262149Application Date: 2009-04-16
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Publication No.: US08971723B2Publication Date: 2015-03-03
- Inventor: Emmanuel Le Taillandier De Gabory , Kiyoshi Fukuchi
- Applicant: Emmanuel Le Taillandier De Gabory , Kiyoshi Fukuchi
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2009/058036 WO 20090416
- International Announcement: WO2010/119576 WO 20101021
- Main IPC: H04J3/00
- IPC: H04J3/00 ; H04B10/077 ; H04L25/14 ; H04J14/04 ; H04J14/02 ; H04L7/00 ; H04J3/06

Abstract:
A method is provided for detecting the skew between parallel light signals generated from a serial data stream. The method can be used with polarization multiplexed signal, as well as with wavelength division multiplexed signals, spatial division multiplexed signals, phase modulated signals, or intensity modulated signals. The method can be used with direct detection schemes as well as with coherent detection schemes. The method is provided with: imprinting dips between a fixed number of transmitted symbols of the parallel signals; detecting an electrical signal related to the dips for each parallel signal; and comparing the electrical signals in delay.
Public/Granted literature
- US20120020660A1 METHOD OF AND SYSTEM FOR DETECTING SKEW BETWEEN PARALLEL SIGNALS Public/Granted day:2012-01-26
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