Invention Grant
- Patent Title: Memory system temperature calibration
- Patent Title (中): 内存系统温度校准
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Application No.: US13350275Application Date: 2012-01-13
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Publication No.: US08971123B2Publication Date: 2015-03-03
- Inventor: Gilad Marko , Shai Tubul , Alex Mostovoy
- Applicant: Gilad Marko , Shai Tubul , Alex Mostovoy
- Applicant Address: IL Kfar Saba
- Assignee: SanDisk IL Ltd
- Current Assignee: SanDisk IL Ltd
- Current Assignee Address: IL Kfar Saba
- Agency: Davis Wright Tremaine LLP
- Main IPC: G11C16/06
- IPC: G11C16/06 ; G11C16/26 ; G11C11/06 ; G11C11/406

Abstract:
A nonvolatile memory system includes a memory controller chip with at least one temperature sensor that is individually calibrated, at a single temperature, after the nonvolatile memory system is assembled, so that the calibration data is stored outside the memory controller chip, in a nonvolatile memory chip, thus obviating the need for components to store calibration data in the memory controller chip.
Public/Granted literature
- US20130182507A1 MEMORY SYSTEM TEMPERATURE CALIBRATION Public/Granted day:2013-07-18
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