Invention Grant
US08970740B2 Overlap patterns and image stitching for multiple-detector compressive-sensing camera
有权
多重检测器压缩感应摄像机的重叠图案和图像拼接
- Patent Title: Overlap patterns and image stitching for multiple-detector compressive-sensing camera
- Patent Title (中): 多重检测器压缩感应摄像机的重叠图案和图像拼接
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Application No.: US14106542Application Date: 2013-12-13
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Publication No.: US08970740B2Publication Date: 2015-03-03
- Inventor: Matthew A. Herman , Donna E. Hewitt , Tyler H. Weston , Lenore McMackin
- Applicant: InView Technology Corporation
- Applicant Address: US TX Austin
- Assignee: In View Technology Corporation
- Current Assignee: In View Technology Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood; Mark K. Brightwell
- Main IPC: H04N5/217
- IPC: H04N5/217 ; G06T5/00 ; G06T5/50

Abstract:
A mechanism for reconstructing sub-images based on measurement data acquired by an imaging system including an array of light modulating elements and an array of photodetectors. Each sub-image is reconstructed based on samples from a respective photodetector and a respective set of measurement patterns defined on a respective virtual sub-region on the modulating array. Each virtual sub-region is configured to include at least the light modulating elements that are able to send a non-trivial amount of light to the respective photodetector during a pattern application period. The virtual sub-regions overlap because many light modulating elements are capable of sending light to more than one photodetector. Whenever a measurement pattern of one virtual sub-region overlaps the measurement pattern of a neighboring virtual sub-region, the two measurement patterns agree by design. Thus, the measurement patterns for the collection of virtual sub-regions combine to form a pattern on the whole modulating array.
Public/Granted literature
- US20140168482A1 OVERLAP PATTERNS AND IMAGE STITCHING FOR MULTIPLE-DETECTOR COMPRESSIVE-SENSING CAMERA Public/Granted day:2014-06-19
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