Invention Grant
US08970740B2 Overlap patterns and image stitching for multiple-detector compressive-sensing camera 有权
多重检测器压缩感应摄像机的重叠图案和图像拼接

Overlap patterns and image stitching for multiple-detector compressive-sensing camera
Abstract:
A mechanism for reconstructing sub-images based on measurement data acquired by an imaging system including an array of light modulating elements and an array of photodetectors. Each sub-image is reconstructed based on samples from a respective photodetector and a respective set of measurement patterns defined on a respective virtual sub-region on the modulating array. Each virtual sub-region is configured to include at least the light modulating elements that are able to send a non-trivial amount of light to the respective photodetector during a pattern application period. The virtual sub-regions overlap because many light modulating elements are capable of sending light to more than one photodetector. Whenever a measurement pattern of one virtual sub-region overlaps the measurement pattern of a neighboring virtual sub-region, the two measurement patterns agree by design. Thus, the measurement patterns for the collection of virtual sub-regions combine to form a pattern on the whole modulating array.
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