Invention Grant
- Patent Title: Reflective extreme ultraviolet mask and method of manufacturing the same
- Patent Title (中): 反射极紫外线掩膜及其制造方法
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Application No.: US13302143Application Date: 2011-11-22
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Publication No.: US08968969B2Publication Date: 2015-03-03
- Inventor: Tae-Geun Kim , Dong-Wan Kim , Dong-Gun Lee , Seong-Sue Kim
- Applicant: Tae-Geun Kim , Dong-Wan Kim , Dong-Gun Lee , Seong-Sue Kim
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2010-0119409 20101129
- Main IPC: G03F1/24
- IPC: G03F1/24 ; G03F1/38

Abstract:
A reflective extreme ultraviolet mask includes a mask substrate having an exposing region and a peripheral region, the mask substrate including a light-scattering portion in the peripheral region, a reflective layer on an upper surface of the mask substrate, the reflective layer having a first opening exposing the light-scattering portion, and an absorbing layer pattern on the reflective layer, the absorbing layer pattern having a second opening in light communication with the first opening.
Public/Granted literature
- US20120135339A1 REFLECTIVE EXTREME ULTRAVIOLET MASK AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2012-05-31
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