Invention Grant
- Patent Title: Temperature evaluation circuit
- Patent Title (中): 温度评估电路
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Application No.: US13226934Application Date: 2011-09-07
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Publication No.: US08947842B2Publication Date: 2015-02-03
- Inventor: Martin Feldtkeller
- Applicant: Martin Feldtkeller
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H02H5/04
- IPC: H02H5/04 ; G01K7/01 ; G01K1/02 ; G01K3/00

Abstract:
An electronic circuit includes a temperature evaluation circuit. The temperature evaluation circuit includes a first sensor circuit with a first output terminal that is configured to sense a first temperature at a first position of the electronic circuit and to generate at the first output terminal a first output current that is dependent on the first temperature. A second sensor circuit includes a second output terminal and is configured to sense a second temperature at a second position of the electronic circuit and to generate at the second output terminal a second output current that is dependent on the second temperature. An evaluation circuit has an input terminal connected to the first output terminal and the second output terminal and is configured to provide an evaluation signal that is dependent on a current received at the input terminal.
Public/Granted literature
- US20130057995A1 Temperature Evaluation Circuit Public/Granted day:2013-03-07
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