Invention Grant
US08947770B2 Systems and methods for measuring power levels in an optical device
有权
用于测量光学器件功率电平的系统和方法
- Patent Title: Systems and methods for measuring power levels in an optical device
- Patent Title (中): 用于测量光学器件功率电平的系统和方法
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Application No.: US13209752Application Date: 2011-08-15
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Publication No.: US08947770B2Publication Date: 2015-02-03
- Inventor: Hongsheng Wang
- Applicant: Hongsheng Wang
- Applicant Address: US NJ Princeton Junction
- Assignee: Aeon Corporation
- Current Assignee: Aeon Corporation
- Current Assignee Address: US NJ Princeton Junction
- Agency: Kaplan Breyer Schwarz & Ottesen, LLP
- Main IPC: H01S5/02
- IPC: H01S5/02 ; H04B10/079 ; G01J1/42 ; G01J1/02 ; H01S5/50 ; H01S5/022 ; H01S5/0683

Abstract:
An apparatus for monitoring optical equipment in an optical circuit is disclosed in which the apparatus may include an optical device situated to receive an optical input signal and to reflect a portion of the energy of the received optical input signal, thereby providing a reflected input signal; a first photodiode located along a path of the reflected input signal, and operable to receive optical energy from the reflected optical input signal and from ambient optical power; a second photodiode located substantially outside the reflection path of the optical input signal; and means for calculating a magnitude of a power level of the optical input signal from values of outputs from the first and second photodiodes.
Public/Granted literature
- US20120038974A1 Systems and Methods for Measuring Power Levels in an Optical Device Public/Granted day:2012-02-16
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