Invention Grant
- Patent Title: Method and arrangement for voltage measurement
- Patent Title (中): 电压测量的方法和布置
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Application No.: US13647548Application Date: 2012-10-09
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Publication No.: US08838402B2Publication Date: 2014-09-16
- Inventor: Ari Wahlroos , Janne Altonen , Pentti Mähönen
- Applicant: ABB Technology AG
- Applicant Address: CH Zurich
- Assignee: ABB Technology AG
- Current Assignee: ABB Technology AG
- Current Assignee Address: CH Zurich
- Agency: Buchanan Ingersoll & Ronney PC
- Priority: EP10159871 20100414
- Main IPC: G01R19/00
- IPC: G01R19/00 ; G06F11/30

Abstract:
A method and an arrangement for voltage measurement with a transformer configuration comprising three single pole voltage transformers having tertiary windings open-delta connected with each other. The arrangement is configured to apply a correction to measured secondary voltages on the basis of one or more parameters of the voltage transformers and/or one or more quantities in a known relation to one or more parameters of the voltage transformers, one or more parameters of a circuit connected to the secondary windings and/or one or more quantities in a known relation to one or more parameters of the circuit connected to the secondary windings, and one or more parameters of a circuit connected to the tertiary windings and/or one or more quantities in a known relation to one or more parameters of the circuit connected to the tertiary windings.
Public/Granted literature
- US20130035886A1 METHOD AND ARRANGEMENT FOR VOLTAGE MEASUREMENT Public/Granted day:2013-02-07
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