Invention Grant
- Patent Title: Multi-bit resistance measurement
- Patent Title (中): 多位电阻测量
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Application No.: US13584120Application Date: 2012-10-28
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Publication No.: US08837198B2Publication Date: 2014-09-16
- Inventor: Chung H. Lam , Jing Li , Robert K. Montoye
- Applicant: Chung H. Lam , Jing Li , Robert K. Montoye
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Ido Tuchman; Vazken Alexanian
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C7/00 ; G11C7/06

Abstract:
An example embodiment is a circuit for determining a binary value of a memory cell. The circuit includes shunt capacitors having different capacitances to selectively couple with the memory cell, and a controller configured to iteratively charge the shunt capacitors to a first voltage until a selected shunt capacitor causes the first voltage to decay through the memory cell to a first reference voltage within a predetermined time range, determine a binary value of the most significant bits of the memory cell based on the selected shunt capacitor, charge the selected shunt capacitor to a second voltage after determining the binary value of the most significant bits of the memory cell, and determine a binary value of the least significant bits of the memory cell based on a decay of the second voltage at the selected shunt capacitor through the memory cell.
Public/Granted literature
- US20140092694A1 MULTI-BIT RESISTANCE MEASUREMENT Public/Granted day:2014-04-03
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