The device for testing a memory of an electric tool has a control unit, a testing module, a buffer memory and an address translator. The control unit is coupled to the memory and configured to control the electric tool. The testing module is coupled to the memory and configured to test a specific memory cell from among a plurality of memory cells of the memory. The buffer memory is configured to provide temporary storage of the data that is stored in the specific memory cell during the testing of the specific memory cell. The address translator is configured to translate the address of the specific memory cell to the address of the buffer memory during the testing of the specific memory cell. A tool and method are also provided.