Invention Grant
- Patent Title: Impedance measurement circuit and method
- Patent Title (中): 阻抗测量电路及方法
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Application No.: US13124399Application Date: 2009-10-08
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Publication No.: US08831898B2Publication Date: 2014-09-09
- Inventor: Robert Pinter , Ralf Schmidt
- Applicant: Robert Pinter , Ralf Schmidt
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP08166754 20081016
- International Application: PCT/IB2009/054413 WO 20091008
- International Announcement: WO2010/044026 WO 20100422
- Main IPC: G06F19/00
- IPC: G06F19/00 ; A61B5/053

Abstract:
An impedance measurement circuit comprises a current source arrangement, a voltage measurement arrangement and a processor. The circuit is operable in a two-point measurement mode and a four-point measurement mode and the processor is adapted to derive the impedance to be measured by combining the measurement voltages from the two-point and the four-point measurement modes. This combines the results of both two-point and four-point measurement techniques to provide improved accuracy. In particular, the two results enable the effect of the electrode resistance to be cancelled.
Public/Granted literature
- US20110208458A1 IMPEDANCE MEASUREMENT CIRCUIT AND METHOD Public/Granted day:2011-08-25
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