Invention Grant
- Patent Title: Flow type particle image analysis method and device
- Patent Title (中): 流式粒子图像分析方法及装置
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Application No.: US13375249Application Date: 2010-05-17
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Publication No.: US08831306B2Publication Date: 2014-09-09
- Inventor: Chihiro Manri , Norio Oowada , Satoshi Mitsuyama
- Applicant: Chihiro Manri , Norio Oowada , Satoshi Mitsuyama
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2009-134212 20090603
- International Application: PCT/JP2010/058261 WO 20100517
- International Announcement: WO2010/140460 WO 20101209
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/40 ; G01N15/14

Abstract:
At each of mutually different multiple focal positions, focal adjustment parameter values are obtained from images of standard particles made of the same substance. Each focal adjustment parameter value is figured out as any one of the ratio between the density value around the center of the standard particle image and the density value around the outline, the difference therebetween, and the density value around the center. The in-focus position is adjusted on the basis of the relationship between the obtained focal adjustment parameter values and the focal positions. Moreover, on the basis of the relationship between the focal adjustment parameter values and the focal positions, the parameter values are converted into focal positions, and the focal positions and dispersion thereof are used to check the displacement of the in-focus position and the thickness of the sample liquid.
Public/Granted literature
- US20120076349A1 FLOW TYPE PARTICLE IMAGE ANALYSIS METHOD AND DEVICE Public/Granted day:2012-03-29
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