Invention Grant
- Patent Title: Monitoring apparatus and method
- Patent Title (中): 监测装置及方法
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Application No.: US13427133Application Date: 2012-03-22
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Publication No.: US08831233B2Publication Date: 2014-09-09
- Inventor: Rika Hosaka , Kazushige Ouchi , Kazunori Imoto , Masaaki Kikuchi , Koichi Ootomi
- Applicant: Rika Hosaka , Kazushige Ouchi , Kazunori Imoto , Masaaki Kikuchi , Koichi Ootomi
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Minato-ku, Tokyo
- Agency: Ohlandt, Greeley, Ruggiero & Perle, L.L.P.
- Main IPC: H04R29/00
- IPC: H04R29/00 ; G01H7/00 ; G01H3/08

Abstract:
According to one embodiment, a monitoring apparatus includes an acquisition unit, an analysis unit, a calculation unit, a storage, a determination unit. The acquisition unit acquires an environmental sound. The analysis unit performs frequency analysis to extract characteristic frequency components. The calculation unit calculates first values of metrics. The storage stores contour data generated by second values of the metrics. The determination unit determines whether or not there is a first measurement point in which a first value and a second value match, if there is no first measurement point or the change is not less than the threshold value, determines that the machines is abnormal.
Public/Granted literature
- US20120219157A1 MONITORING APPARATUS AND METHOD Public/Granted day:2012-08-30
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