Invention Grant
- Patent Title: Method for measuring light intensity distribution
- Patent Title (中): 光强分布测量方法
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Application No.: US13729300Application Date: 2012-12-28
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Publication No.: US08830453B2Publication Date: 2014-09-09
- Inventor: Jun Zhu , Jing-Lei Zhu , Kai-Li Jiang , Chen Feng , Ji-Qing Wei , Guo-Fan Jin , Shou-Shan Fan
- Applicant: Jun Zhu , Jing-Lei Zhu , Kai-Li Jiang , Chen Feng , Ji-Qing Wei , Guo-Fan Jin , Shou-Shan Fan
- Applicant Address: CN Beijing TW New Taipei
- Assignee: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Beijing TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN201210192083 20120612
- Main IPC: G01J1/00
- IPC: G01J1/00 ; G01J1/42

Abstract:
A method for measuring intensity distribution of light includes a step of providing a carbon nanotube array located on a surface of a substrate. The carbon nanotube array has a top surface away from the substrate. The carbon nanotube array with the substrate is located in an inertia environment or a vacuum environment. A light source irradiates the top surface of the carbon nanotube array, to make the carbon nanotube array radiate a visible light. A reflector is provided, and the visible light is reflected by the reflector. An imaging element images the visible light reflected by the reflector, to obtain an intensity distribution of the light source.
Public/Granted literature
- US20130329213A1 METHOD FOR MEASURING LIGHT INTENSITY DISTRIBUTION Public/Granted day:2013-12-12
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