Invention Grant
- Patent Title: Exposure apparatus, and device manufacturing method
- Patent Title (中): 曝光装置和装置制造方法
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Application No.: US13449430Application Date: 2012-04-18
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Publication No.: US08830445B2Publication Date: 2014-09-09
- Inventor: Akimitsu Ebihara
- Applicant: Akimitsu Ebihara
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2003-174259 20030619
- Main IPC: G03B27/42
- IPC: G03B27/42 ; G03B27/52 ; B82Y10/00 ; G03F7/20

Abstract:
A lithographic projection apparatus includes an illumination system that conditions a radiation beam, a support structure that holds a patterning device, the patterning device being capable of imparting the radiation beam with a pattern, a substrate table that holds a substrate, and a projection system that projects the patterned radiation beam onto a target portion of the substrate. In addition, a liquid supply system provides a liquid to a space between the projection system and the substrate, the liquid supply system having a member. A liquid seal device forms a liquid seal between the member and the substrate.
Public/Granted literature
- US20120200837A1 EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD Public/Granted day:2012-08-09
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