Invention Grant
- Patent Title: Rapid screening buffer layers in photovoltaics
- Patent Title (中): 光伏快速筛选缓冲层
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Application No.: US13019024Application Date: 2011-02-01
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Publication No.: US08829930B2Publication Date: 2014-09-09
- Inventor: Frederick Alyious List, III , Enis Tuncer
- Applicant: Frederick Alyious List, III , Enis Tuncer
- Applicant Address: US TN Oak Ridge
- Assignee: UT-Battelle, LLC
- Current Assignee: UT-Battelle, LLC
- Current Assignee Address: US TN Oak Ridge
- Agency: Pauley Petersen & Erickson
- Main IPC: G01R27/08
- IPC: G01R27/08 ; G01R31/26 ; G01R1/073 ; G01R27/02

Abstract:
An apparatus and method of testing electrical impedance of a multiplicity of regions of a photovoltaic surface includes providing a multi-tipped impedance sensor with a multiplicity of spaced apart impedance probes separated by an insulating material, wherein each impedance probe includes a first end adapted for contact with a photovoltaic surface and a second end in operable communication with an impedance measuring device. The multi-tipped impedance sensor is used to contact the photovoltaic surface and electrical impedance of the photovoltaic material is measured between individual first ends of the probes to characterize the quality of the photovoltaic surface.
Public/Granted literature
- US20120194205A1 RAPID SCREENING BUFFER LAYERS IN PHOTOVOLTAICS Public/Granted day:2012-08-02
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