Invention Grant
- Patent Title: Method and apparatus for monitoring physical properties
- Patent Title (中): 用于监测物理性质的方法和装置
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Application No.: US13589969Application Date: 2012-08-20
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Publication No.: US08829924B2Publication Date: 2014-09-09
- Inventor: Naftaly Ramrajkar
- Applicant: Naftaly Ramrajkar
- Applicant Address: CA Vancouver, BC
- Assignee: Smart Autonomous Solutions, Inc.
- Current Assignee: Smart Autonomous Solutions, Inc.
- Current Assignee Address: CA Vancouver, BC
- Agency: Manelli Selter PLLC
- Agent Edward J. Stemberger
- Main IPC: G01R27/04
- IPC: G01R27/04

Abstract:
This invention relates to methods and apparatus for measuring physical properties using microwave cavity sensors. In operation, a number of microwave cavity sensors are interrogated by a remote wireless unit in order to determine the current resonant frequency for the sensor. The current values for various parameters measured by the sensors, such as temperature, stress/stain, or the like, are determined by comparing the current resonant frequency to a first resonant frequency of the sensor, and thus, detect any change in the value of the selected parameter. In particular, the present invention is directed toward extending the range over which such measurements may be performed, using these types of sensors.
Public/Granted literature
- US20140049268A1 Method And Apparatus For For Monitoring Physical Properties Public/Granted day:2014-02-20
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