Invention Grant
- Patent Title: Charged particle beam lens having a particular support electrically insulating first and second electrodes from each other
- Patent Title (中): 具有特定支撑的带电粒子束透镜彼此电绝缘第一和第二电极
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Application No.: US14118963Application Date: 2012-05-10
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Publication No.: US08829465B2Publication Date: 2014-09-09
- Inventor: Koichi Tsunoda
- Applicant: Koichi Tsunoda
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2011-131963 20110614
- International Application: PCT/JP2012/062572 WO 20120510
- International Announcement: WO2012/172913 WO 20121220
- Main IPC: H01J37/12
- IPC: H01J37/12 ; H01J37/00 ; H01J37/317

Abstract:
A charged particle beam lens includes a first electrode including a surface having at least one aperture and a second electrode including a surface having at least one aperture. A support intervenes between the first electrode and the second electrode to electrically insulate the first and second electrodes from each other and to support the first and second electrodes in a predetermined positional relationship. A side surface of the support intervenes between the first electrode and the second electrode and includes a non-flat portion having at least one of a projected portion and a depressed portion, and includes a tapered portion. A taper angle formed by the tapered portion and the surface having the aperture of the second electrode is greater than zero degree and less than ninety degrees.
Public/Granted literature
- US20140103223A1 CHARGED PARTICLE BEAM LENS Public/Granted day:2014-04-17
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