Invention Grant
- Patent Title: Implementing conductive microcapsule rupture to generate a tamper event for data theft prevention
- Patent Title (中): 实施导电微胶囊破裂,以产生防盗数据的篡改事件
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Application No.: US13682128Application Date: 2012-11-20
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Publication No.: US08819842B2Publication Date: 2014-08-26
- Inventor: Dylan J. Boday , Joseph Kuczynski , Jason T. Wertz , Jing Zhang
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Joan Pennington
- Main IPC: G06F21/00
- IPC: G06F21/00

Abstract:
A method and circuit for implementing conductive microcapsule rupture to generate a tamper event for data theft prevention, and a design structure on which the subject circuit resides are provided. A polymeric resin containing microcapsules surrounds a security card and a tamper sensor device provided with the securing card. Each microcapsule contains a conductive material. The conductive material of the microcapsule disperses onto the tamper sensor device on the security card responsive to the microcapsule being ruptured to create a change in resistance, reducing the resistance of a security mesh of the tamper sensor device. The microcapsules are more sensitive to pressure than a tamper mesh of the tamper sensor device and therefore rupture first, creating the change in resistance when dispersed onto the tamper sensor device. The resistance change is detected by the tamper sensor device and the security card is disabled to prevent data theft.
Public/Granted literature
- US20140143881A1 IMPLEMENTING CONDUCTIVE MICROCAPSULE RUPTURE TO GENERATE A TAMPER EVENT FOR DATA THEFT PREVENTION Public/Granted day:2014-05-22
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